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| W. C. Chien, Y. C. Chen, E. K. Lai, Y. D. Yao, P. Lin, S. F. Horng, J. Gong, T. H. Chou, H. M. Lin, M. N. Chang, Y. H. Shih, K. Y. Hsieh, R. Liu, and Chih-Yuan Lu, “Unipolar Switching Behaviors of RTO WOXRRAM”, IEEE Electron Device Letters 31, 126 (2010/2). |
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Yung-Ling Lan, Hung-Cheng Lin, Hsueh-Hsing Liu, Geng-Yen Lee, Fan Ren, Stephen J. Pearton, Mao-Nan Chang, Jen-Inn Chyi, “Low-resistance smooth-surface Ti/Al/Cr/Mo/Au n-type Ohmic contact to AlGaN/GaN heterostructures”, Applied Physics Letters 94, 243502 (2009/6). (IF: 4.096) |
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Mao-Nan Chang, Ruo-Syuan Lin, Hsueh-Hsing Liu, Hung-Min Lin, Hung-Cheng Lin, and Jen-Inn Chyi, “Investigations of Photo-assisted Conductive Atomic Force Microscopy on III-Nitrides”, Microelectronics Journal 40, 353 (2009/2). ( IF: 0.848) |
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G. T. Chen, C. H. Chan, C. H. Hou, H. H. Liu, N. W. Shiu, M. N. Chang, C. C. Chen, J.-I. Chyi, “Epitaxial lateral overgrowth of GaN on AlGaN/(111)Si micropillar array fabricated by microsphere lithography”, Gallium Nitride Materials and Devices III 6894, 89408 (2008). |
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C. C. Hsu, R. Q. Hsu, Y. H. Wu, T. W. Chi, C. H. Chiang, J. F. Chen, M. N. Chang, “Analysis of InAsN quantum dots by transmission electron microscopy and photoluminescence”, Ultramicroscopy 108, 1495 (2008).(IF: 2.629) |
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M. N. Chang, T. H. Chou, C. Y. Yang, and J. H. Liang, “The factors influencing the stability of scanning capacitance spectroscopy”,Microscopy of Semiconducting Materials 120, 467 (2008). |
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Guan-Ting Chen, Shih-Pang Chang, Jen-Inn Chyi, and Mao-Nan Chang, “Growth and characterization of crack-free semipolar { }InGaN/GaN multiple-quantum-well on v-grooved (001)Si substrates”, Applied Physics Letters 92, 241904 (2008/6). (IF: 4.096) |
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Guan-Ting Chen, Jen-Inn Chyi, Chia-Hua Chan, Chia-Hung Hou, Chii-Chang Chen, and Mao-Nan Chang, “Crack-free GaN grown on AlGaN/(111)Si micropillar array fabricated by polystyrene microsphere lithography”, Applied Physics Letters 91, 261910 (2007/12). (IF: 4.068) F Times cited: 1 |
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T. C. Cheng, P. Y. Chen, W. J. Huang, K. H. Hsu, H. T. Hsueh, M. N. Chang, and J. S. Wu, “NanoManipulation Measurement and PIC Simulation of Field-emission Properties from a Single Crystallized Silicon Nano-Emitter”, Nanotechnology 18, 225503 (2007/5). (IF: 3.511) |
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M. H. Cheng, T. C. Cheng, W. J. Huang, M. N. Chang, “Influence of oxygen diffusion on residual stress for tantalum thin films”, Journal of Vacuum Science & Technology B 25, 147 (2007/1-2). (IF: 1.548) F Times cited: 2 |
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